In Section 4.1, we analysed the simple MOS current mirror
under the assumption, that the parameters VT and were
identical for both transistors of the current mirror. We concluded that
the current amplification of the current mirror, B0, did not depend
on the values of the process parameters, only on the dimensions of the
transistors. In this Section, the consequence of minor differences in these
parameters is analysed in detail.
First assume, that the threshold voltages, VT1 and VT2, differ
by a small amount, . The following notation is used:
Referring to Figure 4.1, the input voltage is calculated using
Equation (3.2):
The output current is calculated using Equation (3.2):
B0 denotes the desired current amplification. We realise that a
difference in threshold voltage, , results in a
relative error in the current amplification by
VIN-VT is the `designed' value .
The relative error is minimised by
Now assume, that and COX are slightly different for the two
transistors:
Using Equation (4.6), we calculate the resulting amplification
of the current mirror:
Again, B0 denotes the desired value, while B denotes the actual
amplification. A relative difference in or COX results in
a relative error on the current amplification:
Similarly, such relative errors may be reduced using compensating layout
techniques, e.g. common centroid layout.
Similar considerations apply to systematic variations in the transistor
dimensions, common to all transistors. We now assume that the drawn
dimensions W and L of any transistor are altered by common, yet
unknown, amounts. The effective transistor dimensions are:
Inserting this into Equation (4.6) expressing the current
mirror amplification, results in:
Again, B0 denotes the desired current amplification, achieved using
the designed transistor dimensions. The relative error is
Errors due to systematic changes in transistor dimensions can be
eliminated or reduced by
Unit transistors have been mentioned as a means of reducing errors due to threshold voltage differences and systematic transistor dimension corrections. The basic idea is to use identical transistors with channel length LU and channel width WU, i.e. all transistors are expected to have almost identical parameters. The influence of actual transistor dimensions on threshold voltage and current factor will be the same for all unit transistors.
If we imagine that transistor M1 in Figure 4.1 is realised
as Q unit transistors in parallel, and transistor M2 is realised
as P unit transistors in parallel, the amplification of the current
mirror is
denotes the current factor of a unit transistor. In this manner,
any rational current amplification can be realised precisely.